Ultra-high-quality large ingot growth system

New technique
(NOC、NOn-contact Crucible)

to grow High-Quality and Large Si crystal

Description

This new system incorporates the benefits of cast growth method, the Czochralski(CZ) method, Kyropoulos methodto have a function for the growth of the high-quality silicon crystal. The low-temperature region is formed in the silicon melt upper, growing ingot by pulling up the silicon crystal continuously using a seed crystal. 

※ This document was allowed to be diverted from JST FUTURE-PV Innovation project material.

Feature

  • Furnace structure reduces the particles of carbon hot zone
  • Energy saving structure reduces running cost
  • Could be operated from a separate room by remote control function
  • Easy seeding mechanism

Specification

Crystal sizeMax. φ500×H400(mm)
Crystal weightMax. 100kg
Heating methodResistance heating method with 2 zone carbon heater
Heating temperatureMax. 1600℃、operationg temp. 1550℃
AtmosphereAtmospheric pressure with an inert gas or reduced-pressure atmosphere
Take-out of chamberLower part take-out mechanism by elevating the chamber bottom